Optimal NAND Flash validation requires analysis of the NAND Flash signals as seen by the Flash components. This allows for the highest confidence that the signals captured are representative, contain little interference, and present the maximum possible data eye size. Nexus Technology’s component interposers allow for any oscilloscope to be used for probing Flash signals extremely close to the Flash components.
XH Series EdgeProbeTM
These XH Series interposers include our patented EdgeProbeTM technology, enabling measurements of the highest data rates while allowing the interposer to be virtually the same size as the memory component.
- XH Series: New Design for Emerging and Leading-Edge Computer Memories
- EdgeProbeTM: Interposer fits in any application
Simulation & De-Embedding
S-Parameters are included for target simulation and the creation of de-embedding filters for use with an oscilloscope.
Product Configuration Table
| Nomenclature | Package Size | Channels Probed | Quantity |
|---|---|---|---|
| NEX-NAND304XHEPCH03 | 304 Ball | Channel 0 Channel 3 |
1 |
| NEX-NAND304XHEPCH12 | 304 Ball | Channel 1 Channel 2 |
1 |
Available Accessories
| Type | Desc. | Quantity | Nomenclature |
|---|---|---|---|
| Riser | Riser elevates interposer .050″ | 1 | NEX-RSRNAND304 |
Attachment Service
Nexus Technology’s expert attachment service provides a ready-to-go test solution customized to your application. We will attach the interposer and any additional accessories to your application’s target. We can also power-on and test your application to confirm functionality. Please contact us for more information.
Mechanical Outlines
NEX-NAND304XHEPCH03
NEX-NAND304XHEPCH12
NEX-RSRNAND304